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Micron Technology is a world leader in innovating memory and storage solutions that accelerate the transformation of information into intelligence, inspiring the world to learn, communicate and advance faster than ever.
As a Senior Reticle Pattern Inspection Process Engineer, you will develop and optimize advanced photomask inspection solutions supporting current and next-generation lithography technologies. This role focuses on reticle defect detection, automated defect classification, mask-to-wafer correlation, printability assessment, and inspection capability development. You will provide technical leadership across inspection programs while driving improvements in quality, yield, and manufacturing readiness through advanced analytics, AI-enabled workflows, and multi-functional collaboration.
Responsibilities:
- Develop, qualify, optimize, and sustain reticle pattern inspection processes, including EUV inspection and automated defect classification.
- Lead defect characterization, printability assessment, and mask-to-wafer correlation activities to improve inspection effectiveness and defect disposition decisions.
- Drive root-cause investigations and process improvements using SPC, FMEA, 8D, and data-driven problem-solving methodologies.
- Lead equipment qualifications, supplier evaluations, technology assessments, and production-readiness activities for advanced inspection platforms.
- Partner with lithography, mask engineering, manufacturing, R&D, and suppliers to introduce next-generation inspection capabilities and improve yield, productivity, and process stability.
Minimum Qualifications:
- Master\'s degree in Physics, Optics, Electrical Engineering, Materials Science, Mechanical Engineering, Chemical Engineering, or related field; or Bachelor\'s degree with significant directly relevant industry experience.
- 5+ years of experience in photomask engineering, reticle inspection, wafer inspection, semiconductor defect engineering, advanced lithography, or related semiconductor manufacturing environments.
- Experience developing, optimizing, qualifying, or sustaining advanced inspection processes and manufacturing systems.
- Strong understanding of defect detection, defect classification, inspection sensitivity, nuisance reduction, and process optimization.
- Experience leading technical projects and solving manufacturing challenges using statistical analysis and structured problem-solving methodologies.
Preferred Qualifications:
- Experience with EUV reticle inspection, High-NA EUV technologies, defect printability assessment, or mask-to-wafer correlation.
- Experience with lithography simulation, aerial image analysis, wafer print checks, or physics-based defect assessment.
- Experience developing automated defect classification, machine learning, advanced analytics, or AI-enabled inspection solutions.
- Experience defining inspection-tool requirements and collaborating with equipment suppliers on emerging technologies.
- Experience qualifying new equipment, software, algorithms, or manufacturing processes in advanced semiconductor environments.
As a world leader in the semiconductor industry, Micron is dedicated to your personal wellbeing and professional growth. Micron benefits are designed to help you stay well, provide peace of mind and help you prepare for the future. We offer a choice of medical, dental and vision plans in all locations enabling team members to select the plans that best meet their family healthcare needs and budget. Micron also provides benefit programs that help protect your income if you are unable to work due to illness or injury, and paid family leave. Additionally, Micron benefits include a robust paid time-off program and paid holidays. For additional information regarding the Benefit programs available, please see the Benefits Guide posted on .
Micron is proud to be an equal opportunity workplace and is an affirmative action employer. All qualified applicants will receive consideration for employment without regard to race, color, religion, sex, sexual orientation, age, national origin, citizenship status, disability, protected veteran status, gender identity or any other factor protected by applicable federal, state, or local laws.
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