SEM/FIB/TEM Process Technician

Position 1

SEM Process Technician

NanoFab 300 South 255 Fuller Road Ste 214 Albany NY USA 12203

12 Months contract

Responsibilities
Collect, Prepare, image, and document the structure and/or composition of nanostructures related to semiconductor devices.
o Manage the queue of samples and cleaving/analysis instructions from the Process Engineering staff
o Sample preparation by hand cleave and micro-cleaver using tweezers
o Sample highlighting including but not limited for dilute Hydrofluoric Acid
o Imaging sample features utilizing Scanning Electron Microscopy (SEM]
o Collecting compositional feature data utilizing Energy-dispersive X-ray spectroscopy (EDX)
o Communicating imaging results to the Engineering staff
Development and optimization of analysis techniques
Train new users on sample Preparation and Analysis Equipment
Update and maintain Training and certification documents for sample Preparation and Analysis Equipment
Actively participate and contribute to continuous SEM Operations efficiency improvement
Possible responsibilities could include in FAB operations
Qualifications
BS degree in Physical Science or equivalent experience is required
Previous hands-on experience with X-SEM
o Hitachi SEM experience is greatly preferred
Proficient use of handling samples ? 5mm with tweezers required
The unrestricted right to work in the USA is required
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Position 2

FIB/TEM Process Technician

NanoFab 300 South 255 Fuller Road Ste 214 Albany NY USA 12203

12 Months contract

Responsibilities

• 
  Collect, prepare, image, and document the structure and/or composition of nanostructures related to semiconductor devices.
  o Manage the queue of samples and cleaving/analysis instructions from the Process Engineering staff
  o Lamella preparation using Focused Ion Beam (FIB) tools
  o Sample preparation for FIB stub by hand cleave and tweezers
  o Transfer Grids to sample holders using tweezers
  o Imaging sample features utilizing Scanning Electron Microscopy (SEM], Transmission Electron Microscopy (TEM), Scanning Transmission Electron Microscopy (STEM)
  o Collecting compositional feature data utilizing Energy-dispersive X-ray spectroscopy (EDX) and Electron Energy Loss Spectroscopy (EELS)
  o Communicating image and compositional results to the Engineering staff
  Development and optimization of sample preparation and analysis techniques
  Train new users on sample Preparation and Analysis Equipment
  Update and maintain Training and certification documents for sample Preparation and Analysis Equipment
  Actively participate and contribute to continuous FIB Operations efficiency improvement
  Possible responsibilities could include in FAB operations

Qualifications
BS degree in Physical Science or equivalent experience is required
Previous hands-on experience with FIB and/or STEM/TEM
o Hitachi/ThermoFisher non-automated FIB experience preferred
o ThermoFisher TEM experience preferred
o Hitachi SEM experience preferred
The unrestricted right to work in the USA is required

Ability to work Compressed Work Week Night Shift (i.e. 6pm 6am) and weekends is required