Santa Clara, California
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Today
Required Technical Skills: 5+ years of hands-on experience in Design for Test (DFT) and Automatic Test Pattern Generation (ATPG) for SoC or ASIC designs. Strong understanding of DFT fundamentals, including controllability, observability, and scan-based testing. Proven expertise in ATPG pattern generation, analysis, and debugging. Experience with MBIST, including memory test architectures and diagnostics. Knowledge of I/O test methodologies for interface-level and pin-level validation. Solid
Full-time



